Normal view MARC view ISBD view

Characterization of organic thin films /

Characterization of organic thin films / Abraham Ulman, editors Yale Strausser and Gary E.Mcguire ; series editors, C.Richard Brundle and Charles A.Evans - New York : Momentum, 2010 - xvii, 276 p. : ill. ; 23 cm. - Materials characterization series .

ISBN: 1606500449 9781606500446

Subjects--Topical Terms:
Organic thin films

LC Class. No.: QC176.9.O73 / .C42 2010

Place recall
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)