CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /
Pavlov, Andrei
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev - Dordrecht : Springer, 2008 - xvi, 193 p. : ill. ; 25 cm. - Frontiers in electronic testing ; 40 .
9781402083624 1402083629
Metal oxide semiconductors, Complementary --Design
Random access memory
Nanoelectronics
TK7871.99.M44 / .P38 2008
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev - Dordrecht : Springer, 2008 - xvi, 193 p. : ill. ; 25 cm. - Frontiers in electronic testing ; 40 .
9781402083624 1402083629
Metal oxide semiconductors, Complementary --Design
Random access memory
Nanoelectronics
TK7871.99.M44 / .P38 2008