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Thin film analysis by x-ray scattering /

Birkholz, Mario. ,

Thin film analysis by x-ray scattering / Mario Birkholz. - xxii, 356 pages : illustrations ; 25 cm.

ISBN: 3527310525

Subjects--Topical Terms:
Thin films.
X-ray spectroscopy.

LC Class. No.: QC176.83 / .B57 2006

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