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Value analysis tear-down : a new process for product development and innovation /

Sato, Yoshihiko. ,

Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman. - x, 206 pages : illustrations ; 24 cm.

ISBN: 9780831132033 0831132035

Subjects--Topical Terms:
Value analysis (Cost control).
Industrial productivity.
New products.
Engineering economy.

LC Class. No.: HD47.3 / .S27 2005

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