Normal view MARC view ISBD view

VLSI test principles and architectures : design for testability /

VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - xxx, 777 pages : illustrations ; 24 cm. - The Morgan Kaufmann series in systems on silicon .

ISBN: 9780123705976 0123705975

Subjects--Topical Terms:
Integrated circuits --Very large scale integration --Testing.
ntegrated circuits --Very large scale integration --Design.

LC Class. No.: TK7874.75 / .V58 2006

Place recall
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)