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Atomic scale characterization and first-principles studies of Si3N4 interfaces/

Walkosz, Weronica. ,

Atomic scale characterization and first-principles studies of Si3N4 interfaces/ Weronica Walkosz. - xiii, 108 pages : illustrations 24 cm. - Springer Theses . - Springer Theses .

Includes bibliographical references and index

ISBN: 9781441978165

Subjects--Topical Terms:
Interfaces (Physical sciences).
Condensed matter.

LC Class. No.: QC173.4.I57 / .W34 2011

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