Statistical methods for reliability data /
Meeker, William Q
Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar - xxii, 680 pages : illlustrations ; 25 cm. - Wiley series in probability and statistics. Applied probability and statistics section . - Wiley series in probability and statistics. Applied probability and statistics .
"A Wiley-Interscience publication."
Includes bibliographical references (p. 645-663) and indexes.
Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications
97039270
Reliability (Engineering)--Statistical methods
TS173
Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar - xxii, 680 pages : illlustrations ; 25 cm. - Wiley series in probability and statistics. Applied probability and statistics section . - Wiley series in probability and statistics. Applied probability and statistics .
"A Wiley-Interscience publication."
Includes bibliographical references (p. 645-663) and indexes.
Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications
97039270
Reliability (Engineering)--Statistical methods
TS173