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Lock-in thermography : basics and use for functional diagnostics of electronic components /

Breitenstein, O.. ,

Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp. - viii, 193 pages : illustrations (some color) ; 24 cm. - Springer series in advanced microelectronics .

ISBN: 3540434399

Subjects--Topical Terms:
Electronic apparatus and appliances --Thermal properties.
Electronic apparatus and appliances --Testing.
Semiconductors --Thermal properties.
Thermography.

LC Class. No.: TK7870.25 / .B73 2003

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