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Oxide reliability : a summary of silicon oxide wearout, breakdown and reliability /

Oxide reliability : a summary of silicon oxide wearout, breakdown and reliability / editor, D. J. Dumin. - ix, 270 pages : illustrations ; 26 cm. - Selected topics in electronics and systems ; v. 23 .

ISBN: 9810248423

Subjects--Topical Terms:
Metal oxide semiconductors --Reliability.
Silicon oxide --Deterioration.

LC Class. No.: TK7871.99.M44 / .O94 2002

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