MARC details
000 -LEADER |
fixed length control field |
02301cam a2200385 i 4500 |
001 - CONTROL NUMBER |
control field |
u526682 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
IIUM |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20240619150614.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
160121t1998 nyua g b 001 0 eng c |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
97039270 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0471143286 (hardback) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780471143284 (hardback) |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
UIAM |
Language of cataloging |
eng |
Description conventions |
rda |
050 00 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TS173 M494S 1998 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Meeker, William Q |
245 10 - TITLE STATEMENT |
Title |
Statistical methods for reliability data / |
Statement of responsibility, etc. |
William Q. Meeker, Luis A. Escobar |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
New York : |
Name of producer, publisher, distributor, manufacturer |
Wiley, |
Date of production, publication, distribution, manufacture, or copyright notice |
1998 |
264 #4 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Date of production, publication, distribution, manufacture, or copyright notice |
1998 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xxii, 680 pages : |
Other physical details |
illlustrations ; |
Dimensions |
25 cm. |
336 ## - CONTENT TYPE |
Content type term |
text |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
unmediated |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
volume |
Source |
rdacarrier |
490 1# - SERIES STATEMENT |
Series statement |
Wiley series in probability and statistics. Applied probability and statistics section |
500 ## - GENERAL NOTE |
General note |
"A Wiley-Interscience publication." |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references (p. 645-663) and indexes. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Reliability (Engineering) |
General subdivision |
Statistical methods |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Escobar, Luis A |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Wiley series in probability and statistics. |
Name of part/section of a work |
Applied probability and statistics |
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
a |
.b10573197 |
b |
05-05-21 |
c |
23-02-21 |
998 ## - LOCAL CONTROL INFORMATION (RLIN) |
-- |
m |
Operator's initials, OID (RLIN) |
23-02-21 |
Cataloger's initials, CIN (RLIN) |
m |
First date, FD (RLIN) |
a |
-- |
- |
-- |
eng |
-- |
nyu |
-- |
0 |