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Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland
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TextPublication details: New York : Taylor & Francis, 2001Edition: 3rd edDescription: x, 251 p. : ill. ; 23 cmISBN: - 9780748409686 (pbk.)
- 0748409688 (pbk.)
- QH212.E4 .G66 2001
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QH212.E4 .G66 2001 (Browse shelf(Opens below)) | Available | 1000263351 |
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| QH212.A78 .L53 2011 Life at the nanoscale : atomic force microscopy of live cells / | QH212.A78 .M67 2010 Atomic force microscopy for biologists / | QH212.E4 .E33 2005 Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / | QH212.E4 .G66 2001 Electron microscopy and analysis / | QH212.E4 .L68 2013 Low voltage electron microscopy : principles and applications / | QH212.N43 .N36 2009 Nano-optics and near-field optical microscopy / | QH212.S28 .S22 2001 Scanning electrochemical microscopy / |
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