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Modeling nanoscale imaging in electron microscopy / editors, Thomas Vogt, Wolfgang Dahmen, Peter Binev.
Material type:
TextSeries: Publisher: New York : Springer, 2012Description: ix, 182 pages : illustrations (some color) ; 24 cmContent type: - text
- unmediated
- volume
- 9781461421900
- QH212.S34 .M62 2012
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QH212.S34 .M62 2012 (Browse shelf(Opens below)) | Available | 1000291151 |
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| QH212.S33 .B57 2003 Scanning probe microscopes : applications in science and technology / | QH212.S33 .M67 2013 Hybridizing surface probe microscopies : toward a full description of the meso- and nanoworlds / | QH212.S33 .S22 2010 Scanning probe microscopy in nanoscience and nanotechnology / | QH212.S34 .M62 2012 Modeling nanoscale imaging in electron microscopy / | QH212.S34 .S22 2011 Scanning transmission electron microscopy : imaging and analysis/ | QH212.S35 .R62 2007 Roadmap of scanning probe microscopy / | QH212.T7 .T72 2013 Transmission electron microscopy in micro-nanoelectronics / |
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