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Semiconductor material and device characterization / Dieter K. Schroder.
Material type:
TextPublisher: New York : John Wiley, 1998Edition: 2nd edDescription: xxiv, 780 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 0471241393
- QC611 .S33 1998
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC611 .S33 1998 (Browse shelf(Opens below)) | Available | 1000086675 | ||
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC611 .S33 1998 (Browse shelf(Opens below)) | Available | 1000036789 |
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| QC611 .P64 2007 Polarization effects in semiconductors : from ab initio theory to device application / | QC611 .S33 1990 Semiconductor material and device characterization / | QC611 .S33 1998 Semiconductor material and device characterization / | QC611 .S33 1998 Semiconductor material and device characterization / | QC611 .S33 2006 Semiconductor material and device characterization / | QC611 .S33 2006 Semiconductor material and device characterization / | QC611 .S45 2008 Semiconductor nanostructures / |
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