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Electronic thin film science : for electrical engineers and materials scientists / King-Ning Tu, James W. Mayer and Leonard C. Feldman.
Material type:
TextPublisher: New York : Macmillan, 1992Description: xvii, 428 pages : illustrations ; 25 cm.+ 1 case studyContent type: - text
- unmediated
- volume
- 0024215759
- QC176.9.M84 .T8 1992
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.9.M84 .T8 1992 (Browse shelf(Opens below)) | Available | 1000007966 | ||
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.9.M84 .T8 1992 (Browse shelf(Opens below)) | Available | 1000119800 | ||
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.9.M84 .T8 1992 (Browse shelf(Opens below)) | Available | 1000073244 |
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| QC176.84 .S97 2011 Surface and thin film analysis : a compendium of principles, instrumentation, and applications / | QC176.84.O7 .Q56 2013 A practical guide to optical metrology for thin films / | QC176.9.M84 .M84 2003 Multilayer thin films : sequential assembly of nanocomposite materials / | QC176.9.M84 .T8 1992 Electronic thin film science : for electrical engineers and materials scientists / | QC176.9.M84 .T8 1992 Electronic thin film science : for electrical engineers and materials scientists / | QC176.9.M84 .T8 1992 Electronic thin film science : for electrical engineers and materials scientists / | QC176.9.O73 .C42 2010 Characterization of organic thin films / |
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