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Total-reflection x-ray fluorescence analysis / Reinhold Klockenkamper.
Material type:
TextSeries: Publisher: New York : John Wiley, 1997Description: xvii, 245 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 0471305243
- QD96.X2 .K56 1997
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QD96.X2 .K56 1997 (Browse shelf(Opens below)) | Available | 1000086896 |
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| QD96.P7 .R52 2011 Essential practical NMR for organic chemistry / | QD96.R34 .H36 2001 Handbook of Raman spectroscopy : from the research laboratory to the process line / | QD96.V53 .N62 2004 Two-dimensional correlation spectroscopy : applications in vibrational and optical spectroscopy / | QD96.X2 .K56 1997 Total-reflection x-ray fluorescence analysis / | QD96.X2 .P72 1998 A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis / | QD96.X2 .X72 2004 X-Ray spectrometry : recent technological advances / | QD96.15 .M76 2009 Reka bentuk dan realisasi spektroskopi jelmaan fourier inframerah jauh / |
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