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X-ray metrology in semiconductor manufacturing / D. Keith Bowen, Brian K. Tanner.
Material type:
TextPublisher: Boca Raton, FL : Taylor and Francis, 2006Description: 279 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 0849339286
- TK7874.58 .B68 2006
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | TK7874.58 .B68 2006 (Browse shelf(Opens below)) | Available | 1000187503 |
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| TK7874.55 .S27 2003 Modern placement techniques / | TK7874.55 .S34 2002 IC mask design : essential layout techniques / | TK7874.55 .S34 2012 High-performance integrated circuit design / | TK7874.58 .B68 2006 X-ray metrology in semiconductor manufacturing / | TK7874.58 .B69 2008 Generating hardware assertion checkers : for hardware verification, emulation, post-fabrication debugging and on-line monitoring / | TK7874.58 .C37 2007 Metric-driven design verification : an engineer's and executive's guide to first pass success / | TK7874.58 .G76 2006 Integrated circuit test engineering : modern techniques / |
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