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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman, James W. Mayer.
Material type:
TextPublisher: New York : Springer, 2006Description: xiv, 336 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 0387292608
- 9780387292601
- QC176.83 .A43 2006
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.83 .A43 2006 (Browse shelf(Opens below)) | Available | 1000194930 |
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| QC176.8.T8 .R39 2014 Quantum theory of tunneling / | QC176.8.W3 .W64 1998 Imaging phonons : acoustic wave propagation in solids / | QC176.82 .N36 2004 Nanostructured thin films and nanodispersion strengthened coatings / | QC176.83 .A43 2006 Fundamentals of nanoscale film analysis / | QC176.83 .B57 2006 Thin film analysis by x-ray scattering / | QC176.83 .B57 2006 Thin film analysis by x-ray scattering / | QC176.83 .I57 2001 In situ real-time characterization of thin films / |
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