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Focused Ion Beam Systems: Basics and Applications / edited by Yao Nan.
Material type:
TextPublisher: Cambridge : Cambridge University Press, 2007Description: xi, 395 pages : illustrations ; 26 cmContent type: - text
- unmediated
- volume
- 9780521831994
- 0521831997
- QC702.7.B65 .F62 2007
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC702.7.B65 .F62 2007 (Browse shelf(Opens below)) | Available | 1000235147 |
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| QC689.6.L37 .S44 2009 Self-focusing : past and present : fundamentals and prospects / | QC7 .B67 2007 Physics : decade by decade / | QC7 .G73 1959 Great experiments in physics : firsthand accounts from Galileo to Einstein / | QC702.7.B65 .F62 2007 Focused Ion Beam Systems: Basics and Applications / | QC702.7.B65 .N36 2013 Nanofabrication by ion-beam sputtering : fundamentals and applications / | QC702.7.B65 .N36 2013 Nanofabrication by ion-beam sputtering : fundamentals and applications / | QC702.7.B65 .W36 2009 Handbook of modern ion beam materials analysis / |
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