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Reliability of MEMS / edited by Osamu Tabata and Toshiyuki Tsuchiya.

Contributor(s): Material type: TextTextSeries: Publisher: Weinheim : John Wiley, 2008Description: xx, 303 pages : illustrations ; 25 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 3527314946
  • 9783527314942
Subject(s): LOC classification:
  • TK7875  .R42 2008
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