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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.
Material type:
TextPublisher: New York : Springer, 2005Description: xii, 202 pages : illustrations ; 25 cmContent type: - text
- unmediated
- volume
- 0387258000
- 9780387258003
- QH212.E4 .E33 2005
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QH212.E4 .E33 2005 (Browse shelf(Opens below)) | Available | 1000214927 |
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| QH212.A78 .A86 2012 Atomic force microscopy in liquid : biological applications/ | QH212.A78 .L53 2011 Life at the nanoscale : atomic force microscopy of live cells / | QH212.A78 .M67 2010 Atomic force microscopy for biologists / | QH212.E4 .E33 2005 Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / | QH212.E4 .G66 2001 Electron microscopy and analysis / | QH212.E4 .L68 2013 Low voltage electron microscopy : principles and applications / | QH212.N43 .N36 2009 Nano-optics and near-field optical microscopy / |
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