Electron beam testing technology / edited by John T. L. Thong.

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TextSeries: Publisher: New York : Plenum Press, 1993Description: xvi, 462 pages : illustrations ; 25 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871.85 .E53 1993 (Browse shelf(Opens below))	Available		1000110364

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Previous	TK7871.85 .D44 2005 Delta-doping of semiconductors /	TK7871.85 .D55 2006 Principles of semiconductor devices /	TK7871.85 .E28 1996 The essence of solid-state electronics /	TK7871.85 .E53 1993 Electron beam testing technology /	TK7871.85 .E84 2002 ESD in silicon integrated circuits /	TK7871.85 .G47 2005 Gettering and defect engineering in semiconductor technology XI : GADEST 2005 : proceedings of the 11th international autumn meeting /	TK7871.85 .G47 2008 Gettering and defect engineering in semiconductor technology XII : GADEST 2007 : Proceedings of the 12th International Autumn Meeting EMFCSC, Erice, Italy : October 14-19, 2007 /	Next

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