Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.

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TextPublisher: Hoboken : Wileys, 2013Description: xix, 347 pages : illustrations (some color) ; 24 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TA417.23 .S324 2013 (Browse shelf(Opens below))	Available		1000313562

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Previous	TA417.2 .R48 2007 Review of progress in quantitative nondestructive evaluation /	TA417.23 .B73 1999 Microstructural characterization of materials /	TA417.23 .S32 2005 Scanning probe microscopy : characterization, nanofabrication and device application of functional materials /	TA417.23 .S324 2013 Scanning probe microscopy for industrial applications : nanomechanical characterization /	TA417.35 .P44 1995 Test equipment /	TA417.35 .R36 2007 Practical eddy current testing /	TA417.36 .B34 2012 Solid-state NMR in materials science : principles and applications /	Next

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