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Scanning probe microscopy : characterization, nanofabrication and device application of functional materials / edited by Paula Maria Vilarinho, Yossi Rosenwaks and Angus Kingon.
Material type:
TextSeries: Publisher: New York : Springer, 2005Description: xxxvii, 488 pages : illustrations ; 25 cmContent type: - text
- unmediated
- volume
- 1402030177
- TA417.23 .S32 2005
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | TA417.23 .S32 2005 (Browse shelf(Opens below)) | Available | 1000188211 |
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| TA417.2 .R34 2007 Practical non-destructive testing / | TA417.2 .R48 2007 Review of progress in quantitative nondestructive evaluation / | TA417.23 .B73 1999 Microstructural characterization of materials / | TA417.23 .S32 2005 Scanning probe microscopy : characterization, nanofabrication and device application of functional materials / | TA417.23 .S324 2013 Scanning probe microscopy for industrial applications : nanomechanical characterization / | TA417.35 .P44 1995 Test equipment / | TA417.35 .R36 2007 Practical eddy current testing / |
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