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Accelerated testing : statistical models, test plans and data analysis / Wayne B. Nelson.

By: Material type: TextTextSeries: Publisher: Hoboken, NJ : John Wiley, 2004Edition: 2nd edDescription: xiv, 601 pages : illustrations ; 25 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 0471697362
Subject(s): LOC classification:
  • QA276.N45  .N44 2004
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Holdings
Item type Current library Call number Status Date due Barcode
Books - Printed PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General QA276.N45 .N44 2004 (Browse shelf(Opens below)) Available 1000185541

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