Measurement and modeling of silicon heterostructure devices / edited by John D. Cressler.

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Material type: Text

TextPublisher: Boca Raton, FL : CRC Press, 2008Description: 1 volume (various pagings) : illustrations ; 26 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871.96.B55 .M42 2008 (Browse shelf(Opens below))	Available		1000213547

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