TY  - BOOK
AU  - Lau,W.S..
TI  - Infrared characterization for microelectronics
SN  - 9789810223526
AV  - TK7871  .L38 1999
PY  - 1999///
CY  - Hoboken, NJ
PB  - World Scientific
KW  - Microelectronics
KW  - Materials
KW  - Testing
KW  - Infrared spectroscopy
KW  - Absorption spectra
ER  -