Characterization of organic thin films / 
Abraham Ulman, editors Yale Strausser and Gary E.Mcguire ; series editors, C.Richard Brundle and Charles A.Evans 
 - New York :  Momentum,  2010 
 - xvii, 276 p. :  ill. ;  23 cm. 
 - Materials characterization series .
<br/><br/><label>ISBN: </label>1606500449 9781606500446 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Organic thin films
<br/><br/><label>LC Class. No.: </label>QC176.9.O73   / .C42 2010