Goodhew, Peter J. <br/><br/>
Electron microscopy and analysis / 
Peter J. Goodhew, John Humphreys, Richard Beanland 
 - 3rd ed. 
 - New York :  Taylor & Francis,  2001 
 - x, 251 p. :  ill. ;  23 cm. 
<br/><br/><label>ISBN: </label>9780748409686 (pbk.) 0748409688 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy
<br/><br/><label>LC Class. No.: </label>QH212.E4   / .G66 2001