Pavlov, Andrei <br/><br/>
CMOS SRAM circuit design and parametric test in nano-scaled technologies :  process-aware SRAM design and test / 
Andrei Pavlov, Manoj Sachdev 
 - Dordrecht :  Springer,  2008 
 - xvi, 193 p. :  ill. ;  25 cm. 
 - Frontiers in electronic testing ;  40 .
<br/><br/><label>ISBN: </label>9781402083624 1402083629 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary --Design<br/>Random access memory<br/>Nanoelectronics
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44   / .P38 2008