TY  - BOOK
AU  - Pavlov,Andrei
AU  - Sachdev,Manoj
TI  - CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test 
T2  - Frontiers in electronic testing
SN  - 9781402083624
AV  - TK7871.99.M44  .P38 2008
PY  - 2008///
CY  - Dordrecht
PB  - Springer
KW  - Metal oxide semiconductors, Complementary
KW  - Design
KW  - Random access memory
KW  - Nanoelectronics
ER  -