Operational risk management :  a practical approach to intelligent data analysis / 
edited by Ron S. Kenett, Yossi Raanan. 
 - Chichester :  John Wiley & Sons,   2010. 
 - xxxvii, 285 p. :  ill. ;  23 cm. 
<br/><br/><label>ISBN: </label>9780470747483 (cloth) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Risk management.<br/>Quality control.<br/>Information technology --Quality control.<br/>Process control.
<br/><br/><label>LC Class. No.: </label>HD61  / .O66 2011