Electromigration in thin films and electronic devices :  materials and reliability / 
edited by Choong-Un Kim. 
 - xiii, 340 pages :  illustrations ;  25 cm. 
 - Woodhead Publishing in materials .
<br/><br/><label>ISBN: </label>9781845699376 1845699378 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Deterioration.<br/>Electrodiffusion.<br/>Thin films.<br/>Interconnects (Integrated circuit technology).
<br/><br/><label>LC Class. No.: </label>TK7874   / .E53 2011