Modeling nanoscale imaging in electron microscopy / 
editors, Thomas Vogt, Wolfgang Dahmen, Peter Binev. 
 - ix, 182 pages :  illustrations (some color) ;  24 cm. 
 - Nanostructure science and technology .
<br/><br/><label>ISBN: </label>9781461421900 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning transmission electron microscopy --Simulation methods.<br/>Image analysis.
<br/><br/><label>LC Class. No.: </label>QH212.S34   / .M62 2012