TY  - BOOK
AU  - Vogt,Thomas
AU  - Dahmen,Wolfgang
AU  - Binev,Peter
TI  - Modeling nanoscale imaging in electron microscopy
T2  - Nanostructure science and technology
SN  - 9781461421900
AV  - QH212.S34  .M62 2012
PY  - 2012///
CY  - New York
PB  - Springer
KW  - Scanning transmission electron microscopy
KW  - Simulation methods
KW  - Image analysis
ER  -