TY  - BOOK
AU  - Runyan,W.R..
AU  - Shaffner,T.J.
TI  - Semiconductor measurements and instrumentation
SN  - 0070576971
AV  - QC611.24  .R86 1998
PY  - 1998///
CY  - New  York
PB  - McGraw-Hill
KW  - Semiconductors
KW  - Physical measurements
ER  -