In situ real-time characterization of thin films / 
edited by Orlando Auciello, Alan R. Krauss. 
 - xi, 263 pages :  illustrations ;  24 cm. 
<br/><br/> A Wiley-Interscience Publication 
<br/><br/><label>ISBN: </label>0471241415 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.
<br/><br/><label>LC Class. No.: </label>QC176.83   / .I57 2001