Sato, Yoshihiko. , <br/><br/>
Value analysis tear-down :  a new process for product development and innovation / 
Yoshihiko Sato and J. Jerry Kaufman. 
 - x, 206 pages :  illustrations ;  24 cm. 
<br/><br/><label>ISBN: </label>9780831132033 0831132035 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Value analysis (Cost control).<br/>Industrial productivity.<br/>New products.<br/>Engineering economy.
<br/><br/><label>LC Class. No.: </label>HD47.3   / .S27 2005