TY  - BOOK
AU  - Fleetwood,Daniel M.
AU  - Pantelides,Sokrates T.
AU  - Schrimpf,Ronald D.
TI  - Defects in microelectronic materials and devices
SN  - 9781420043761
AV  - TK7871  .D43 2009
PY  - 2009///
CY  - Boca Raton, FL
PB  - CRC
KW  - Microelectronics
KW  - Materials
KW  - Testing
KW  - Metal oxide semiconductor field-effect transistors
KW  - Integrated circuits
KW  - Defects
ER  -