VLSI test principles and architectures :  design for testability / 
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. 
 - xxx, 777 pages :  illustrations ;  24 cm. 
 - The Morgan Kaufmann series in systems on silicon .
<br/><br/><label>ISBN: </label>9780123705976 0123705975 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits --Very large scale integration --Testing.<br/>ntegrated circuits --Very large scale integration --Design.
<br/><br/><label>LC Class. No.: </label>TK7874.75   / .V58 2006