TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoqing
TI  - VLSI test principles and architectures: design for testability 
T2  - The Morgan Kaufmann series in systems on silicon
SN  - 9780123705976
AV  - TK7874.75  .V58 2006
PY  - 2006///
CY  - Boston
PB  - Elsevier
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - ntegrated circuits
KW  - Design
ER  -