Egerton, Ray F. , <br/><br/>
Physical principles of electron microscopy :  an introduction to TEM, SEM, and AEM / 
Ray F. Egerton. 
 - xii, 202 pages :  illustrations ;  25 cm. 
<br/><br/><label>ISBN: </label>0387258000 9780387258003 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy.
<br/><br/><label>LC Class. No.: </label>QH212.E4   / .E33 2005