TY  - BOOK
AU  - Garg,Rajesh
AU  - Khatri,Sunil P.
TI  - Analysis and design of resilient VLSI circuits: mitigating soft errors and process variations 
SN  - 9781441909305
AV  - TK7874.75  .G37 2010
PY  - 2010///
CY  - New York
PB  - Springer
KW  - Integrated circuits
KW  - Very large scale integration
ER  -