Meeker, William Q <br/><br/>
Statistical methods for reliability data / 
William Q. Meeker, Luis A. Escobar 
 - xxii, 680 pages :  illlustrations ;  25 cm. 
 - Wiley series in probability and statistics. Applied probability and statistics section .
 - Wiley series in probability and statistics.  Applied probability and statistics .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references (p. 645-663) and indexes. 
<br/><br/>Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications 
<br/><br/><label>ISBN: </label>0471143286 (hardback) 9780471143284 (hardback) 
<br/><br/><label>LCCN: </label>97039270 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering)--Statistical methods
<br/><br/><label>LC Class. No.: </label>TS173 M494S 1998