TY  - BOOK
AU  - Brandon,D G.
AU  - Kaplan,Wayne
TI  - Microstructural characterization of materials
SN  - 0471985015
AV  - TA417.23  .B73 1999
PY  - 1999///
CY  - Chichester
PB  - John Wiley
KW  - Materials
KW  - Microscopy
KW  - Microstructure
ER  -