Scanning probe microscopy for industrial applications :  nanomechanical characterization / 
edited by Dalia G. Yablon. 
 - xix, 347 pages :  illustrations (some color) ;  24 cm. 
<br/><br/><label>ISBN: </label>9781118288238 1118288238 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy.<br/>Scanning probe microscopy--Industrial applications.<br/>Technology & Engineering --Nanotechnology & Mems.
<br/><br/><label>LC Class. No.: </label>TA417.23   / .S324 2013