Nanoscale characterisation of ferroelectric materials :  scanning probe microscopy approach / 
edited by M. Alexe, A. Gruverman. 
 - xiii, 282 pages :  illustrations (some color) ;  24 cm. 
 - Nanoscience and technology .
 - Nanoscience and technology .
<br/><br/>Includes index and bibliographical references  
<br/><br/><label>ISBN: </label>3540206620 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials.<br/>Nanotechnology.
<br/><br/><label>LC Class. No.: </label>TA418.9.N35   / .N39 2004