TY  - BOOK
AU  - Ueda,Osamu
ED  - Materials Research Society.
ED  - Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II"
TI  - Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II: symposium held April 9-13, 2012, San Francisco, California, U.S.A. 
T2  - Materials Research Society symposium proceedings
SN  - 9781605114095
AV  - TK7871.85  .R44 2012
PY  - 2012///
CY  - Warrendale, Pa.
PB  - Materials Research Society
KW  - Materials
KW  - Reliability
KW  - Congresses
KW  - Semiconductors
KW  - Microelectronics
ER  -