Wai, Kin Chim. , <br/><br/>
Semiconductor device and failure analysis :  using photon emission microscopy / 
Wai Kin Chim. 
 - xv, 269 pages :  illustrations ;  24 cm. 
<br/><br/><label>ISBN: </label>047149240X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors --Failures.<br/>Semiconductors --Testing.<br/>Semiconductors --Microscopy.<br/>Photon emission.
<br/><br/><label>LC Class. No.: </label>TK7871.852   / .W34 2000