TY  - BOOK
AU  - Wai,Kin Chim
TI  - Semiconductor device and failure analysis: using photon emission microscopy 
SN  - 047149240X
AV  - TK7871.852  .W34 2000
PY  - 2000///
CY  - Chichester
PB  - John Wiley
KW  - Semiconductors
KW  - Failures
KW  - Testing
KW  - Microscopy
KW  - Photon emission
ER  -