Breitenstein, O.. , <br/><br/>
Lock-in thermography :  basics and use for functional diagnostics of electronic components / 
O. Breitenstein, M. Langenkamp. 
 - viii, 193 pages :  illustrations (some color) ;  24 cm. 
 - Springer series in advanced microelectronics .
<br/><br/><label>ISBN: </label>3540434399 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances --Thermal properties.<br/>Electronic apparatus and appliances --Testing.<br/>Semiconductors --Thermal properties.<br/>Thermography.
<br/><br/><label>LC Class. No.: </label>TK7870.25   / .B73 2003